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SKU/Artículo: AMZ-1480092851
Focused Beam Methods: Measuring Microwave Materials in Free Space
Format:
Paperback
Detalles del producto
Disponibilidad:
En stock
En stock
Peso con empaque:
0.44 kg
0.44 kg
Devolución:
Sí
Sí
Condición
Nuevo
Nuevo
Producto de:
Amazon
Amazon
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USA
USA
Sobre este producto
- Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.
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S/ 240.28
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S/ 109.22
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