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SKU/Artículo: AMZ-052114230X
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Format:
Paperback
Detalles del producto
Disponibilidad:
En stock
En stock
Peso con empaque:
0.49 kg
0.49 kg
Devolución:
Sí
Sí
Condición
Nuevo
Nuevo
Producto de:
Amazon
Amazon
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USA
USA
Sobre este producto
- Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
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S/ 495.16
55% OFF
S/ 225.08
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