Artículo: AMZ-047184893X

Ionizing Radiation Effects in MOS Devices and Circuits

Format:

Hardcover

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1.07 kg
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  • The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
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$968,12
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$387,25

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